Stress imbalance significantly affects the performance of a press-pack insulated gate bipolar transistor (IGBT). Time-variant loads and conditions lead to the stress fluctuations. exacerbating the impacts. The conventional reliability optimization faces efficiency barriers due to the nested time-variant reliability analysis and design optimization. https://www.chiggate.com/jerome-brown-philadelphia-eagles-mitchell-ness-1990-legacy-jersey-discount/